

SOKA TECHNOLOGY
GaN on Sapphire wafer 4inch P GaN Gallium nitride Semiconductor Substrate
Size:4inch
Quantity:6 pieces
Quantity:
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Size:4inch
Quantity:6 pieces
Quantity:
Size:4inch
Quantity:6 pieces
Quantity:
♦️High-quality GaN wafer for Research and Experiment.
♦️Provide small quantities, special specifications products, and customized services
♦️Global shipping, secure payment, large inventory.
♦️Minimum delivery time within 1 week. Shipped by FedEx, DHL,UPS, etc.
GaN on Sapphire Specification:
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Size: 2inch ;
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Mg-Doped;
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Diameter: 50.8 mm±0.3 mm ;
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Thickness/Thickness STD: 4.5 ± 0.5 μm / < 3% ;
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Orientation of GaN: C plane (0001) off angle toward A-axis 0.2 ± 0.1°;
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Orientation Flat of GaN: (1-100) 0 ± 0.2°, 16 ± 1 mm;
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Conduction Type: P-Type;
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Resistivity (300K):< 10 Ω·cm;
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Carrier Concentration:> 1 x 1017 cm -3 (doping concentration of p+GaN ≥ 5 x 1019 cm -3);
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Mobility: > 5cm2/V·s ;
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Structure:~ 0.5 μm p+GaN/~ 1.5 μm p-GaN /~ 2.5 μm uGaN /~ 25 nm uGaN buffer/430 ±25 μm sapphire;
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XRD FWHMs: (0002)<300 arcsec,(10-12)<400 arcsec;
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Orientation of Sapphire: C plane (0001) off angle toward M-axis 0.2 ± 0.1°;
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Orientation Flat of Sapphire: (11-20) 0 ± 0.2°, 16 ± 1 mm ;
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Sapphire Polish: Single-side polished (SSP)/Double-side polished (DSP);
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UseableArea:> 90% (edge and macro defects exclusion);
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Wafer case ;
