| Silicon nitride powder |
| Items |
Value |
Test method |
Standard |
| α/% |
≥93 |
X-ray diffraction method |
JIS R1640 |
| O/% |
<1.3 |
Infrared absorption method |
ASTM C1494 |
| C/% |
<0.1 |
Infrared absorption method |
ASTM C1494 |
| Free Si% |
<0.1 |
- |
- |
| N/% |
≥38.6 |
Infrared absorption method |
ASTM C1494 |
| Fe/ppm |
<300 |
Atomic absorption spectroscopy |
DB13/T 1232-2010 |
| Al/ppm |
<150 |
Atomic absorption spectroscopy |
DB13/T 1232-2010 |
| Ca/ppm |
<150 |
Atomic absorption spectroscopy |
DB13/T 1232-2010 |
| Silicon nitride powder(ultra-fine) |
| Items |
Value |
Test method |
Standard |
| α/% |
≥92 |
X-ray diffraction method |
JIS R1640 |
| O/% |
<1.3 |
Infrared absorption method |
ASTM C1494 |
| C/% |
<0.1 |
Infrared absorption method |
ASTM C1494 |
| N/% |
≥38.6 |
Infrared absorption method |
ASTM C1494 |
| Fe/ppm |
<400 |
Atomic absorption spectroscopy |
DB13/T 1232-2010 |
| Al/ppm |
<200 |
Atomic absorption spectroscopy |
DB13/T 1232-2010 |
| Ca/ppm |
<200 |
Atomic absorption spectroscopy |
DB13/T 1232-2010 |
| Size(μm) |
D50<0.5 |
Laser particle size analyzer |
GB/T 19077.1 |
| D90<1.3 |