Silicon Carbide Substrate 4inch 6inch Semi Insulating 4H NG Grade SiC Wafer IGBT
♦️High-quality SiC wafer for Research and Experiment.
♦️Provide small quantities, special specifications products, and customized services.
♦️Global shipping, secure payment, large inventory.
♦️Minimum delivery time within 1 week. Shipped by FedEx, DHL,UPS, etc.
SiC Substrate Specification:
-
Size: 4inch;
-
Diameter: 100.8 mm ±0.5;
-
Thickness: 500 um±25;
-
Surface Orientation: <0001>±0.2°;
-
Primary flat orientation:[11-20]±5°;
-
Secondary flat orientation: Silicon face up 90°CW. from Prime flat±5°;
-
Micropipe: N/A;
-
Resistivity: N/A;
-
TTV≤10um;
-
Warp≤45um;
-
Bow≤≤30um;
-
Surface Roughness: Si face Ra≤0.5 nm;
-
Cracks: None;
-
Wafer edge: Bevelling;
-
Surface finish: Double Side Polish, Si Face CMP;
-
Packing: Multi-wafer Cassette Or Single Wafer Container;
The difference between NG grade and Dummy grade products mainly in the poly area on the surface.
NG grade poly area is more than 5%.
NG grade products are mainly used for equipment testing and have better cost performance.
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♦️High-quality SiC wafer for Research and Experiment.
♦️Provide small quantities, special specifications products, and customized services.
♦️Global shipping, secure payment, large inventory.
♦️Minimum delivery time within 1 week. Shipped by FedEx, DHL,UPS, etc.
SiC Substrate Specification:
-
Size: 4inch;
-
Diameter: 100.8 mm ±0.5;
-
Thickness: 500 um±25;
-
Surface Orientation: <0001>±0.2°;
-
Primary flat orientation:[11-20]±5°;
-
Secondary flat orientation: Silicon face up 90°CW. from Prime flat±5°;
-
Micropipe: N/A;
-
Resistivity: N/A;
-
TTV≤10um;
-
Warp≤45um;
-
Bow≤≤30um;
-
Surface Roughness: Si face Ra≤0.5 nm;
-
Cracks: None;
-
Wafer edge: Bevelling;
-
Surface finish: Double Side Polish, Si Face CMP;
-
Packing: Multi-wafer Cassette Or Single Wafer Container;
The difference between NG grade and Dummy grade products mainly in the poly area on the surface.
NG grade poly area is more than 5%.
NG grade products are mainly used for equipment testing and have better cost performance.
♦️High-quality SiC wafer for Research and Experiment.
♦️Provide small quantities, special specifications products, and customized services.
♦️Global shipping, secure payment, large inventory.
♦️Minimum delivery time within 1 week. Shipped by FedEx, DHL,UPS, etc.
SiC Substrate Specification:
-
Size: 4inch;
-
Diameter: 100.8 mm ±0.5;
-
Thickness: 500 um±25;
-
Surface Orientation: <0001>±0.2°;
-
Primary flat orientation:[11-20]±5°;
-
Secondary flat orientation: Silicon face up 90°CW. from Prime flat±5°;
-
Micropipe: N/A;
-
Resistivity: N/A;
-
TTV≤10um;
-
Warp≤45um;
-
Bow≤≤30um;
-
Surface Roughness: Si face Ra≤0.5 nm;
-
Cracks: None;
-
Wafer edge: Bevelling;
-
Surface finish: Double Side Polish, Si Face CMP;
-
Packing: Multi-wafer Cassette Or Single Wafer Container;
The difference between NG grade and Dummy grade products mainly in the poly area on the surface.
NG grade poly area is more than 5%.
NG grade products are mainly used for equipment testing and have better cost performance.
♦️High-quality SiC wafer for Research and Experiment.
♦️Provide small quantities, special specifications products, and customized services.
♦️Global shipping, secure payment, large inventory.
♦️Minimum delivery time within 1 week. Shipped by FedEx, DHL,UPS, etc.
SiC Substrate Specification:
- Size: 4inch;
- Diameter: 100.8 mm ±0.5;
- Thickness: 500 um±25;
- Surface Orientation: <0001>±0.2°;
- Primary flat orientation:[11-20]±5°;
- Secondary flat orientation: Silicon face up 90°CW. from Prime flat±5°;
- Micropipe: N/A;
- Resistivity: N/A;
- TTV≤10um;
- Warp≤45um;
- Bow≤≤30um;
- Surface Roughness: Si face Ra≤0.5 nm;
- Cracks: None;
- Wafer edge: Bevelling;
- Surface finish: Double Side Polish, Si Face CMP;
- Packing: Multi-wafer Cassette Or Single Wafer Container;
